產品詳情
簡單介紹:
HVS-1000Z型自動轉塔數顯顯微硬度計采用大示屏LCD顯示,菜單式結構,選擇硬度標尺HV或HK,硬度值相互轉換,物鏡/壓頭自動切換,測試結果和數據處理自動儲存,也可通過打印機輸出,RS-232接口與計算機連網。
詳情介紹:
HVS-1000Z型自動轉塔數顯顯微硬度計采用大示屏LCD顯示,菜單式結構,選擇硬度標尺HV或HK,硬度值相互轉換,物鏡/壓頭自動切換,測試結果和數據處理自動儲存,也可通過打印機輸出,RS-232接口與計算機連網。
適用范圍
熱處理、碳化、淬火硬化層,表面覆層,鋼,有色金屬,微小及薄形零件等。
熱處理、碳化、淬火硬化層,表面覆層,鋼,有色金屬,微小及薄形零件等。
HVS-1000 Digital Micro Vickers Hardness Tester adopts large LCD screen to display and menu type structure to choice hardness scales HV or HK, exchange hardness values among scales, store testing results and data procession automatically, as well as output by printer. By means of interface of RS-232, the instrument can be linked with computer.
Usage Range:
Heat treated layer, carbonized layer, hardened hard layers, superficial coating, steels, non-ferrous metal, micro and thin shaped components.
Heat treated layer, carbonized layer, hardened hard layers, superficial coating, steels, non-ferrous metal, micro and thin shaped components.
技術數據(Technical Specifications)
試驗力
(Testing Force) |
10g (0.098N)、25g (0.245N)、50g (0.49N)、100g (0.98N )、
200g (1.96N)、300g (2.94N)、500g (4.9N)、1000g (9.8N) |
轉換標尺(Exchanging Scales) |
洛氏、表面洛氏、布氏 ( Rockwell, Superficial Rockwell, Brinell) |
小測量單位(Min Measuring Unit) |
0.031μm |
總放大倍數
Magnification of Microscope |
100X(觀察, For Observation )400X(測量, For Measurement) |
數據輸出 (Data Output) |
內置打印機和RS-232接口 ( Inside Printer and RS-232 Interface) |
加荷控制(Loading Control) |
自動(加荷、保荷、卸荷), Automatically (load, keep, unload) |
X-Y測試臺
X-Ystage |
尺寸Dimensions:100×100mm
大移動Travei range:25×25mm |
儀器重量( Net Weight ) |
25kg |
試件大高度
(Max Height of Specimen) |
85mm |
電源(Power Supply) |
AC220V±5%,50~60Hz |
執行標準(Carried Standard) |
GB/T4340.2國家標準(GB/T4340.2 Chinese Standard),
JJG151檢定規程 ( JJG151 Inspection Rule ) |
標準配件 附件
Standard Accessories |
物鏡40x、10x,顯微壓頭,數顯測量目鏡10x,標準硬度塊,薄形試臺、圓柱體試臺、平口試臺,水平儀,電源線,輔助工具等
Objectives 40x and 10x, Vickers Indenter, Microscope 10x, Standard Hardness Brocks: 2 pcs, Thin Specimen Testing Table, Column Testing Table, Forcipate Testing Table, Lever, Power Cable, Assistant Tools, etc |